Xianghua Kong, Hengxing Ji, Richard D. Piner, Huifeng Li, Carl W. Magnuson, Cheng Tan, Ariel Ismach, Harry Chou, Rodney S. Ruoff
Non-destructive and rapid evaluation of graphene directly on the growth substrate (Cu foils) by dark field (DF) optical microscopy is demonstrated. Without any additional treatment, graphene on Cu foils with various coverages can be quickly identified by DF imaging immediately after chemical vapor deposition growth with contrast comparable to scanning electron microscopy. The improved contrast of DF imaging compared to bright field optical imaging was found to be due to Rayleigh scattering of light by the copper steps beneath graphene. Indeed, graphene adlayers are readily distinguished, due to the different height of copper steps beneath graphene regions of different thickness.
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http://arxiv.org/abs/1305.5754
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