Sergey Bastrukov, Jun Yong Khoo, Boris Lukiyanchuk, Irina Molodtsova
Spin relaxation in the ultrathin metallic films of stacked microelectronic devices originating from the coupling between precessing vector of magnetization and stress-tensors of intrinsic and extrinsic magnetic anisotropies is investigated on the basis of derived modified Landau-Lifshitz equation of micromagnetic dynamics. Particular attention is given to variation method of computing the time of exponential relaxation and ferromagnetic resonance linewidth relying on equation of the magnetization energy loss and Gabor uncertainty relation between the full-width-at-half-maximum in resonance-shaped line and lifetime of resonance excitation.
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http://arxiv.org/abs/1210.2609
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