1210.0027 (Annett Thøgersen et al.)

Composition and structure of Pd nanoclusters in SiO$_x$ thin film    [PDF]

Annett Thøgersen, Jeyanthinath Mayandi, Lasse Vines, Martin F. Sunding, Arne Olsen, Spyros Diplas, Masanori Mitome, Yoshio Bando

The nucleation, distribution, composition and structure of Pd nanocrystals in SiO$_2$ multilayers containing Ge, Si, and Pd are studied using High Resolution Transmission Electron Microscopy (HRTEM) and X-ray Photoelectron Spectroscopy (XPS), before and after heat treatment. The Pd nanocrystals in the as deposited sample seem to be capped by a layer of PdO$_x$. A 1-2 eV shift in binding energy was found for the Pd-3d XPS peak, due to initial state Pd to O charge transfer in this layer. The heat treatment results in a decomposition of PdO and Pd into pure Pd nanocrystals and SiO$_2$.

View original: http://arxiv.org/abs/1210.0027