Wednesday, June 20, 2012

1206.4231 (X. W. Zhou et al.)

High-fidelity simulations of CdTe vapor deposition from a new bond-order
potential-based molecular dynamics method
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X. W. Zhou, D. Ward, B. M. Wong, F. P. Doty, J. A. Zimmerman, G. N. Nielson, J. L. Cruz-Campa, V. P. Gupta, J. E. Granata, J. J. Chavez, D. Zubia
CdTe has been a special semiconductor for constructing the lowest-cost solar cells and the CdTe-based Cd1-xZnxTe alloy has been the leading semiconductor for radiation detection applications. The performance currently achieved for the materials, however, is still far below the theoretical expectations. This is because the property-limiting nanoscale defects that are easily formed during the growth of CdTe crystals are difficult to explore in experiments. Here we demonstrate the capability of a bond order potential-based molecular dynamics method for predicting the crystalline growth of CdTe films during vapor deposition simulations. Such a method may begin to enable defects generated during vapor deposition of CdTe crystals to be accurately explored.
View original: http://arxiv.org/abs/1206.4231

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