Wednesday, June 26, 2013

1306.5988 (J. Dubowik et al.)

Micromagnetic approach to exchange bias - new look on old problem    [PDF]

J. Dubowik, I. Gościańska
We present a micromagnetic approach to exchange bias (EB) in ferromagnetic (FM)/antiferromagnetic (AFM) thin film systems with a small number of pinned interfacial magnetic moments. We express the exchange bias field $H_{EB}$ in terms of fundamental micromagnetic length scale -- the exchange length $l_{ex}$. The benefit from this approach is a better separation of a term related to FM layer from a term related to FM/AFM coupling at interfaces. Using this approach we estimate the highest limit of $H_{EB}$ in real FM/AFM systems.
View original:

No comments:

Post a Comment