1305.7013 (G. Beutier et al.)

Combined coherent x-ray micro-diffraction and local mechanical loading
on copper nanocrystals    [PDF]

G. Beutier, M. Verdier, M. De Boissieu, B. Gilles, F. Livet, M. -I. Richard, T. W. Cornelius, S. Labat, O. Thomas

Coherent x-ray micro-diffraction and local mechanical loading can be combined to investigate the mechanical deformation in crystalline nanostructures. Here we present measurements of plastic deformation in a copper crystal of sub-micron size obtained by loading the sample with an Atomic Force Microscopy tip. The appearance of sharp features in the diffraction pattern, while conserving its global shape, is attributed to crystal defects induced by the tip.

View original: http://arxiv.org/abs/1305.7013