Tuesday, May 21, 2013

1305.4338 (V. O. Sokolov et al.)

Centers of near-IR luminescence in Bi-doped SiO2 and GeO2:
First-principle modeling and experimental data analysis

V. O. Sokolov, V. G. Plotnichenko, E. M. Dianov
First-principle study of possible bismuth-related centers in SiO2 and GeO2 hosts is performed and the results are compared with the experimental data. The following centers are modeled: trivalent and divalent Bi substitutional centers; BiO interstitial molecule; interstitial ion, Bi^+, and atom, Bi^0; Bi...Si-Si and Bi...Ge-Ge complexes formed by interstitial Bi atoms and glass intrinsic defects, Si-Si or Ge-Ge oxygen vacancies; interstitial dimers, Bi0 and Bi_2^-. Experimental data available on bismuth-related IR luminescence in SiO2:Bi and GeO2:Bi glasses, visible (red) luminescence in SiO2:Bi glass and the luminescence excitation are analyzed. Comparison of the calculated spectral properties of the bismuth-related centers with the experimental data shows that IR luminescence in SiO2:Bi and GeO2:Bi is most likely caused by Bi...Si-Si and Bi...Ge-Ge complexes and divalent Bi substitutional center is probably responsible for the red luminescence in SiO2:Bi.
View original: http://arxiv.org/abs/1305.4338

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