1304.0955 (A. G. Touryanski et al.)

Investigation of quantum-dimensional structure parameters by X-ray
optical, scanning tunneling and transmission electron microscopy    [PDF]

A. G. Touryanski, V. M. Senkov, S. S. Gizha, L. V. Arapkina, V. A. Chapnin, K. V. Chizh, V. P. Kalinushkin, M. S. Storozhevykh, O. V. Uvarov, V. A. Yuryev

Application of the two-wavelength X-ray reflectometry to exploration of Ge/Si(001) hereostructures with dense chains of stacked Ge quantum dots is presented

View original: http://arxiv.org/abs/1304.0955