L F Zagonel, M Bäurer, A Bailly, O Renault, M Hoffmann, S-J Shih, D Cockayne, N Barrett
We have used energy filtered x-ray photoelectron emission microscopy (XPEEM) and synchrotron radiation to measure the grain orientation dependence of the work function of a sintered niobium doped strontium titanate ceramic. A significant spread in work function values is found. Grain orientation and surface reducing/oxidizing conditions are the main factors in determining the work function. Energy filtered XPEEM looks ideally suited for analysis of other technologically interesting polycrystalline samples.
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http://arxiv.org/abs/1210.3086
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