1207.1475 (E. Fohtung et al.)

Probing the three-dimensional strain inhomogeneity and equilibrium
elastic properties of single crystal Ni nanowires    [PDF]

E. Fohtung, J. W. Kim, Keith T. Chan, Ross Harder, Eric E. Fullerton, O. G. Shpyrko

We employ three dimensional x-ray coherent diffraction imaging to map the lattice strain distribution, and to probe the elastic properties of a single crystalline Ni (001) nanowire grown vertically on an amorphous Si02 || Si substrate. The reconstructed density maps show that with increasing wire width, the equilibrium compressive stress in the core region decreases sharply while the surface tensile strain increases, and gradually trends to a nonzero constant. We use the retrieved projection of lattice distortion to predict the Young's Modulus of the wire based on the elasticity theory.

View original: http://arxiv.org/abs/1207.1475