J. Laverock, L. F. J. Piper, A. R. H. Preston, B. Chen, J. McNulty, K. E. Smith, S. Kittiwatanakul, J. W. Lu, S. A. Wolf, P. -A. Glans, J. -H. Guo
Soft x-ray spectroscopy is used to investigate the strain dependence of the
metal-insulator transition of VO2. Changes in the strength of the V 3d - O 2p
hybridization are observed across the transition, and are linked to the
structural distortion. Furthermore, although the V-V dimerization is
well-described by dynamical mean-field theory, the V-O hybridization is found
to have an unexpectedly strong dependence on strain that is not predicted by
band theory, emphasizing the relevance of the O ion to the physics of VO2.
View original:
http://arxiv.org/abs/1202.2286
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