Wednesday, December 19, 2012

1212.4431 (Chetan Dhital et al.)

Inelastic neutron scattering study of phonon density of states in
nanostructured Si1xGex thermoelectrics
   [PDF]

Chetan Dhital, D. L. Abernathy, Gaohua Zhu, Zhifeng Ren, D. Broido, Stephen D. Wilson
Inelastic neutron scattering measurements are utilized to explore relative changes in the generalized phonon density of states of nanocrystalline Si1xGex thermoelectric materials prepared via ball milling and hot-pressing techniques. Dynamic signatures of Ge clustering can be inferred from the data by referencing the resulting spectra to a density functional theoretical model assuming homogeneous alloying via the virtual-crystal approximation. Comparisons are also presented between as-milled Si nanopowder and bulk, polycrystalline Si where a preferential low-energy enhancement and lifetime broadening of the phonon density of states appear in the nanopowder. Negligible differences are however observed between the phonon spectra of bulk Si and hot pressed, nanostructured Si samples suggesting that changes to the single phonon dynamics above 4 meV play only a secondary role in the modified heat conduction of this compound.
View original: http://arxiv.org/abs/1212.4431

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