1211.5540 (P. Garg Triloki et al.)

Structural characterization of as-deposited cesium iodide films studied
by X-ray diffraction and transmission electron microscopy techniques    [PDF]

P. Garg Triloki, B. K. Singh

In this work, Cesium iodide (CsI) thin films with different thickness were prepared by thermal evaporation technique. The particle size of these films were determined by using X-ray diffraction (XRD) as well as by transmission electron microscopy (TEM) techniques. Although these two methods provide similar particle size in the case of semitransparent CsI films (4 nm and 20 nm) with nano scale size, there are discrepancies between the particle size in the case of thicker CsI films (100 nm and 500 nm). It indicates that for larger film thickness, XRD profile fails to determine the particle size in comparison with TEM measurement. Other physical parameters such as strain, stress and deformation energy density values were also estimated precisely for the prominent XRD peaks of thicker CsI films in the range $2\theta = 20^{0}-80^{0}$ by using a modified Williamson-Hall analysis assuming uniform deformation model (UDM), uniform deformation stress model (UDSM) and uniform deformation energy density model (UDEDM). The root mean square lattice strain calculated from the interplanar spacing and the strain calculated through UDM and UDSM were also compared.

View original: http://arxiv.org/abs/1211.5540