Thursday, August 30, 2012

1208.5828 (H. Sato et al.)

CoFeB Thickness Dependence of Thermal Stability Factor in CoFeB/MgO
Perpendicular Magnetic Tunnel Junctions
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H. Sato, M. Yamanouchi, K. Miura, S. Ikeda, R. Koizumi, F. Matsukura, H. Ohno
Thermal stability factor (delta) of recording layer was studied in perpendicular anisotropy CoFeB/MgO magnetic tunnel junctions (p-MTJs) with various CoFeB recording layer thicknesses and junction sizes. In all series of p-MTJs with different thicknesses, delta is virtually independent of the junction sizes of 48-81 nm in diameter. The values of delta increase linearly with increasing the recording layer thickness. The slope of the linear fit is explained well by a model based on nucleation type magnetization reversal.
View original: http://arxiv.org/abs/1208.5828

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